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Home > chinese-english > "probe test" in English

English translation for "probe test"

探测试验
探试器测试
探头检测


Related Translations:
probe element:  探针器元件
venus probe:  金星探测器
caustic probe:  腐蚀药探针
palaption probe:  触诊探头
firedamp probe:  瓦斯探针沼气检定器
resonance probe:  共振探头谐振导体谐振探头
fistula probe:  瘘管探针
probe needle:  探测针
aural probe:  耳探子探声管
telephonic probe:  电发音探子
Example Sentences:
1.Wafer test probe test
晶圆测试探针测试
2.Methods of test for petroleum and its products - industrial quenching oils - determination of cooling characteristics - nickel - alloy probe test method
石油和石油产品试验方法.第414部分;工业淬火油.冷却特性测定.镍合金探头试验法
3.Probe test method that can reveal the relationship of friction and lubrication in deep drawing and its application in automobile industry is proposed
重点介绍了能相对真实地反映拉深过程中法兰处摩擦与润滑变化规律的探针法及其在汽车工业中的应用。
4.This paper mainly accomplished the following research : summarize the classify and application fields of four - probe testing technology ; take the square four - probe testing technology study by using the advantage of rymaszewski method in auto - eliminating the portrait wandering influence to induct ry method to square - probe testing method ; deeply study the influence of probe wandering to progressed ry method testing result ; complete the design of testing panel and testing circuit , realize the auto - testing of mono crystal wafer ; discuss the image enhancement and threshold selection problem in image identify , and finally accomplish the identify of probe pinpoint . the main new view points of the research : 1 . it is the first time for applying image manipulation and analysis technique to the sheet resistance measurement , and achieving the auto - location function of the probe
为此,本文开展了以下研究工作:综述了四探针技术的分类以及应用范围;对方形四探针测试技术进行了研究,利用rymaszewski法自动消除探针纵向游移影响的优点,将它应用于方形探针测试法中,并对探针游移对改进rymaszewski法测试结果的影响进行了深入探讨,提出了用图像识别技术监测测试进行的方法;完成了测试系统的测试平台以及测试电路的设计,研制出具有图像识别功能的斜置式方形探针分析仪一台,实现了硅片电阻率测试的自动化;对图像识别过程中涉及到的图像增强和阈值选择问题进行了论述,最终实现了对探针针尖的图像识别以及探针测试结构的自动调整,保证了方形探针测试仪的测试精度。
5.So in one hand it requires the wafer ' s diameter to be more large in order to enhance the productivity , and on the other hand it puts forward more strict requirement about the crystal perfection and electricity character . especially the electronic character and the equality of micro - area in the crystal wafer has become the key factor to determine whether the device can be made on it or not . so the resistivity measurement of micro - area become one most important procedure in the chip machining . to ensure the produce quality of chip and the perfect performance of final production , the four - probe testing technology need to be deeply studied
图形日益微细化,电路尺寸不断缩小,目前ic制造以8英寸、 0 . 13 m为主,预计在2007年左右将以12英寸、 65nm为主,这一方面要求圆片直径不断增大以提高生产率,另一方面对晶体的完美性、机械及电特性也提出了更为严格的要求。特别是微区的电学特性及其均匀性已经成为决定将来器件性能优劣的关键因素。因此,微区电阻率的测试成为芯片加工之中的重要工序。
Similar Words:
"probe tack" English translation, "probe target" English translation, "probe teat opener" English translation, "probe technique" English translation, "probe temperature" English translation, "probe the air" English translation, "probe the mysteries of" English translation, "probe the mystery of life" English translation, "probe the secrets of the universe" English translation, "probe to flaw distance" English translation